Specific Process Knowledge/Lithography/Coaters: Difference between revisions
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| Line 253: | Line 253: | ||
!Comments | !Comments | ||
|- | |- | ||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|1, | |1,367 | ||
|3, | |3,1% | ||
| | |10/7 2015 | ||
|chasil | |chasil | ||
|with HMDS. Average of 3 wafers | |with HMDS. Average of 3 wafers | ||
| Line 269: | Line 268: | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|1, | |1,409 | ||
| | |2,4% | ||
| | |12/15 2015 | ||
|chasil | |chasil | ||
|with HMDS. Average of 3 wafers | |with HMDS. Average of 3 wafers | ||