Specific Process Knowledge/Wafer cleaning/RCA: Difference between revisions
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|'''General description''' | |'''General description''' | ||
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It is used for removal of light organics, particles and metal. | |||
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It is used for removal of light organics, particles and metal. | |||
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It is used for removal of oxide generated in RCA1 and RCA2 | |||
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|'''Chemical solution''' | |'''Chemical solution''' | ||
| | |H<math>_2</math>O, NH<math>_4</math>OH and H<math>_2</math>O<math>(29%)_2</math>(30%) (5:1:1) | ||
|H<math>_2</math>0, HCl(37%) and H<math>_2</math>O<math>_2</math>(30%) (5:1:1) | |||
|5% HF | |||
|- | |- | ||
|'''Process temperature''' | |'''Process temperature''' | ||
|80 <sup>o</sup>C | |70-80 <sup>o</sup>C | ||
|70-80 <sup>o</sup>C | |||
| | |Room temperature | ||
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|'''Process time''' | |'''Process time''' | ||
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10 min. | 10 min. | ||
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30 sec. | |||
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|'''Allowed materials''' | |'''Allowed materials''' | ||
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*Silicon | |||
*Silicon oxide | |||
*Silicon nitride | |||
*Quartz wafers | |||
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*Silicon | |||
*Silicon oxide | |||
*Silicon nitride | |||
*Quartz wafers | |||
| | |||
*Silicon | |||
*Silicon oxide | |||
*Silicon nitride | |||
|- | |- | ||
|'''Batch size''' | |'''Batch size''' | ||
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1- | 1-25 4" or 6" wafers at a time | ||
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1-25 4" or 6" wafers at a time | |||
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1- | 1-25 4" or 6" wafers at a time | ||
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|'''Size of substrate''' | |'''Size of substrate''' | ||
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4-6" wafers | 4"-6" wafers | ||
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4"-6" wafers | |||
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|} | |} | ||