Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro: Difference between revisions
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<span style="font-size: 90%; text-align: right;">[[Specific_Process_Knowledge/Characterization/XPS/Processing/Basics/1intro#top|Go to top of this page]]</span> | <span style="font-size: 90%; text-align: right;">[[Specific_Process_Knowledge/Characterization/XPS/Processing/Basics/1intro#top|Go to top of this page]]</span> | ||
As shown in the bottom of the image below, some experiments hold several levels - the reason is that the exeriment is a depth profile in which a repeated set of spectra of a sample are recorded as the surface is gradually removed by an ion bombardment. Scroll through the individual levels, either by using the 'Etch time' or 'Etch Level' scroll buttons and see how the spectra change. Level 0 is the first spectrum. | As shown (marked with a red square) in the bottom of the image below, some experiments hold several levels - the reason is that the exeriment is a depth profile in which a repeated set of spectra of a sample are recorded as the surface is gradually removed by an ion bombardment. Scroll through the individual levels, either by using the 'Etch time' or 'Etch Level' scroll buttons and see how the spectra change. Level 0 is the first spectrum. | ||
[[File:XPS-basics03b.jpg|700px]] | [[File:XPS-basics03b.jpg|700px]] | ||
The view called 'Single Trace' displays only one level. Change the display mode to view the complete set of levels: | The view called 'Single Trace' displays only one level - this button is highlighted in the top red square above. Change the display mode to view the complete set of levels by clicking the other buttons in the red square: | ||
<gallery caption="Different views of spectra in experiments with several levels" widths="350" heights="250" perrow="2"> | <gallery caption="Different views of spectra in experiments with several levels" widths="350" heights="250" perrow="2"> | ||