Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions
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# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Open data, spectrum views, depth profile, survey spectrum peak identification, click here]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Open data, spectrum views, depth profile, survey spectrum peak identification, click here]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|Open high resolution spectra, add background and peaks]] | # [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|Open high resolution spectra, add background and peaks, apply constraints to fitting]] | ||
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/3fitting|Complete the analysis]] | |||