Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions

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= XPS data processing guide =
= XPS data processing guide =


This section is intended as an introduction to the analysis of XPS data. Simple examples are chosen to illustrate the procedures. All actions performed with Avantage (version 5.498) during an analysis of a sample are shown.  
This section is intended as an introduction to the analysis of XPS data. Simple examples are chosen to illustrate the procedures. All actions performed with Avantage (version 5.498) during an analysis of a sample are shown. In case you want to follow along with your own analysis, you can download the data from [[Media:20150518_ZnO_CuZn_ZnO.doc]]


# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Open data, spectrum views, depth profile, survey spectrum peak identification, click here]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/1intro|Open data, spectrum views, depth profile, survey spectrum peak identification, click here]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|Open high resolution spectra, add background and peaks]]
# [[Specific Process Knowledge/Characterization/XPS/Processing/Basics/2highres|Open high resolution spectra, add background and peaks]]

Revision as of 14:29, 8 September 2015

XPS data processing guide

This section is intended as an introduction to the analysis of XPS data. Simple examples are chosen to illustrate the procedures. All actions performed with Avantage (version 5.498) during an analysis of a sample are shown. In case you want to follow along with your own analysis, you can download the data from Media:20150518_ZnO_CuZn_ZnO.doc

  1. Open data, spectrum views, depth profile, survey spectrum peak identification, click here
  2. Open high resolution spectra, add background and peaks