Specific Process Knowledge/Characterization/XPS/Processing/Basics: Difference between revisions
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* Maximize spectrum views | * Maximize spectrum views | ||
* Minimize spectrum views | * Minimize spectrum views | ||
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[[File:XPS-basics03.jpg|700px]] | [[File:XPS-basics03.jpg|700px]] | ||
== Analyse survey spectra == | |||
<span style="font-size: 90%; text-align: right;">[[Specific_Process_Knowledge/Characterization/XPS/Processing/Basics#top|Go to top of this page]]</span> | |||
Maximize the view of the survey spectrum: | |||
[[File:XPS-basics04.jpg|700px]] | |||
As shown in the bottom of the image above, this experiment holds several levels - the reason is that the exeriment is a depth profile in which a repeated set of spectra of a sample are recorded as the surface is gradually removed by an ion bombardment. Scroll through the individual levels and see how the spectra change. Level 0 is the first spectrum. | |||
In the top are several bottoms in the 'Analysis' toolbar. Click the leftmost one called Automatic Survey ID and a automated peak identification routine will commence. | |||