Specific Process Knowledge/Characterization: Difference between revisions

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 == Choose equipment ==
-'''SEM's at CEN'''
-*[[/SEM FEI QUANTA 200 3D|FIB-SEM FEI QUANTA 200 3D]]
-*[[/Dual Beam FEI Helios Nanolab 600|Dual Beam FEI Helios Nanolab 600]]
-*[[/SEM FEI Nova 600 NanoSEM|SEM FEI Nova 600 NanoSEM]]
-*[[/SEM FEI Quanta 200 ESEM FEG|SEM FEI Quanta 200 ESEM FEG]]
-*[[/SEM Inspect S|SEM Inspect S]]
-'''SEM's at Danchip'''
-*[[/SEM: Scanning Electron Microscopy |SEM LEO]]
-*[[/SEM: Scanning Electron Microscopy |SEM JEOL]]
-*[[/SEM: Scanning Electron Microscopy |SEM Zeiss]]
-*[[/SEM: Scanning Electron Microscopy |SEM Zeiss Supra 60 VP]]
-*[[/SEM: Scanning Electron Microscopy |SEM Supra 3]]
 '''AFM'''
 *[[/AFM: Atomic Force Microscopy|AFM - ''Atomic Force Microscopy'']]
+'''Element analysis'''
+*[[/SIMS: Secondary Ion Mass Spectrometry#Atomika_SIMS|Atomika SIMS]]
+*[[/XPS#XPS-ThermoScientific|XPS-ThermoScientific ]]
 '''Optical and stylus profilers'''
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 *[[/Optical characterization#Prism_Coupler|Prism Coupler]]
 *[[/PL Mapper|PL mapper - ''Photoluminescence mapper'']]
-'''Element analysis'''
-*[[/SIMS: Secondary Ion Mass Spectrometry#Atomika_SIMS|Atomika SIMS]]
-*[[/XPS#XPS-ThermoScientific|XPS-ThermoScientific ]]
+'''SEM's at CEN'''
+*[[/SEM FEI QUANTA 200 3D|FIB-SEM FEI QUANTA 200 3D]]
+*[[/Dual Beam FEI Helios Nanolab 600|Dual Beam FEI Helios Nanolab 600]]
+*[[/SEM FEI Nova 600 NanoSEM|SEM FEI Nova 600 NanoSEM]]
+*[[/SEM FEI Quanta 200 ESEM FEG|SEM FEI Quanta 200 ESEM FEG]]
+*[[/SEM Inspect S|SEM Inspect S]]
+'''SEM's at Danchip'''
+*[[/SEM: Scanning Electron Microscopy |SEM LEO]]
+*[[/SEM: Scanning Electron Microscopy |SEM JEOL]]
+*[[/SEM: Scanning Electron Microscopy |SEM Zeiss]]
+*[[/SEM: Scanning Electron Microscopy |SEM Zeiss Supra 60 VP]]
+*[[/SEM: Scanning Electron Microscopy |SEM Supra 3]]
+'''TEM's at CEN'''
 '''Various'''
 *[[/Drop Shape Analyzer|Drop Shape Analyzer]]