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Specific Process Knowledge/Characterization/XPS/XPS technique: Difference between revisions

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; Transport towards the vacuum
; Transport towards the vacuum
: The inelastic mean free path of the photoelectrons is very short.  
: The inelastic mean free path of the photoelectrons is very short. The information carried by the photoelectrons will therefore quickly degrade as they collide inelastically and loose part of their energy. This means that only photoelectrons originating from the ~10 topmost atomic layers of the sample contribute to the signal - in this way making XPS extremely surface sensitive. The tail of former photoelectrons with non-specific energy is called the background.


; Detection in the analyzer


; Detection in the analyzer
This causes all electrons undergo inelastic collisions with sample electrons and a tail of


== X-ray Photoelectron Spectroscopy analysis (XPS) ==
== X-ray Photoelectron Spectroscopy analysis (XPS) ==
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