Specific Process Knowledge/Lithography/EBeamLithography/JBX9500Manual: Difference between revisions
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!style="background:#ADD8E6; color:Black"|DISTMEM | !style="background:#ADD8E6; color:Black"|DISTMEM | ||
|This subprogram measures the distortion of the beam deflection within the field | |This subprogram measures the distortion of the beam deflection 7 x 7 positions within the main writing field and generates a distortion correction table. The program sets the distortion directly below the beam (center of the field) to zero. The distortion correction memory in every position in the main writing field is generated by a linear approximation based on the 7 x 7 table. For 0.2 nA or 2 nA, a reasonable convergence value is e.g. 6 nm. | ||
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!style="background:#ADD8E6; color:Black"|DISTBE | !style="background:#ADD8E6; color:Black"|DISTBE | ||
|This subprogram measures | |This subprogram measures the distortion of the beam deflection 7 x 7 positions within the main writing field and generates a distortion correction table. The program sets the distortion directly below the beam (center of the field) to zero. The distortion correction memory in every position in the main writing field is generated by a cubic approximation based on the 7 x 7 table. For 0.2 nA or 2 nA, a reasonable convergence value is e.g. 8 nm. | ||
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