Specific Process Knowledge/Thin Film deposition/ALD/TiO2 deposition using ALD: Difference between revisions
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A low temperatures between 120 <sup>o</sup>C and 150 <sup>o</sup>C an amorphous TiO<sub>2</sub> layer is grown in the ALD, and at higher temperatures between 300 <sup>o</sup>C and 350 <sup>o</sup>C an anatase TiO<sub>2</sub> layer is grown. At temperatures between 150 <sup>o</sup>C and 300 <sup>o</sup>C the TiO<sub>2</sub> layer will be a mixture of both amorphous and anatase TiO<sub>2</sub>. | A low temperatures between 120 <sup>o</sup>C and 150 <sup>o</sup>C an amorphous TiO<sub>2</sub> layer is grown in the ALD, and at higher temperatures between 300 <sup>o</sup>C and 350 <sup>o</sup>C an anatase TiO<sub>2</sub> layer is grown. At temperatures between 150 <sup>o</sup>C and 300 <sup>o</sup>C the TiO<sub>2</sub> layer will be a mixture of both amorphous and anatase TiO<sub>2</sub>. | ||
For Si wafers, | For Si wafers, amorphous TiO<sub>2</sub> is best grown on wafers with native oxide, and anatase TiO<sub>2</sub> is best grown on wafers without native oxide (removed using HF). | ||
===TiO<sub>2</sub> standard recipe=== | ===TiO<sub>2</sub> standard recipe=== | ||
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===TiO<sub>2</sub> deposition rates=== | ===TiO<sub>2</sub> deposition rates=== | ||
In the graphs below the TiO<sub>2</sub> thickness as function of the number of cycles for deposition temperatures between 150 <sup>o</sup>C and 350 <sup>o</sup>C can be seen. From the equations the number of cycles required for a certain thickess can be calculated. All | In the graphs below the TiO<sub>2</sub> thickness as function of the number of cycles for deposition temperatures between 150 <sup>o</sup>C and 350 <sup>o</sup>C can be seen. From the equations the number of cycles required for a certain thickess to be deposited can be calculated. All results have been obtained for Si wafers with native oxide. | ||
<gallery caption="Titanium dioxide thickness as function of number of cycles" widths="300px" heights="300px" perrow="3"> | <gallery caption="Titanium dioxide thickness as function of number of cycles" widths="300px" heights="300px" perrow="3"> | ||
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===TiO<sub>2</sub> results=== | ===TiO<sub>2</sub> results=== | ||
Some some SEM images of TiO<sub>2</sub> deposited on a Si surface at different temperatures between 150 <sup>o</sup>C and 350 <sup>o</sup>C are shown below. Some of samples have been treated with HF (hydrofluoric acid) to remove the native oxide layer | Some some SEM images of TiO<sub>2</sub> deposited on a Si surface at different temperatures between 150 <sup>o</sup>C and 350 <sup>o</sup>C are shown below. Some of samples have been treated with HF (hydrofluoric acid) to remove the native oxide layer just before the ALD deposition. | ||
<gallery caption="Titanium dioxide deposited at different temperatures on a Si surface" widths="250px" heights=" | <gallery caption="Titanium dioxide deposited at different temperatures on a Si surface" widths="250px" heights="180px" perrow="3"> | ||
image:TiO2 150C 1200 cycles Si_HF_treated.jpg| Temperature 150 <sup>o</sup>C, 1200 cycles, HF treated. | image:TiO2 150C 1200 cycles Si_HF_treated.jpg| Temperature 150 <sup>o</sup>C, 1200 cycles, HF treated. | ||
image:TiO2 150C 1200 cycles Si_untreated.jpg| Temperature 150 <sup>o</sup>C, 1200 cycles. | image:TiO2 150C 1200 cycles Si_untreated.jpg| Temperature 150 <sup>o</sup>C, 1200 cycles. | ||
image:TiO2 250C 750cycles_Si_untreated.jpg| Temperature 250 <sup>o</sup>C, 750 cycles. | image:TiO2 250C 750cycles_Si_untreated.jpg| Temperature 250 <sup>o</sup>C, 750 cycles. | ||
</gallery> | </gallery> | ||
<gallery caption="" widths="250px" heights=" | <gallery caption="" widths="250px" heights="180px" perrow="5"> | ||
image:TiO2 1000 cycles 300C Si_HF.jpg| Temperature 300 <sup>o</sup>C, 1000 cycles, HF treated. | image:TiO2 1000 cycles 300C Si_HF.jpg| Temperature 300 <sup>o</sup>C, 1000 cycles, HF treated. | ||
image:TiO2 1000 cycles 300C Si_un.jpg| Temperature 300 <sup>o</sup>C, 1000 cycles. | image:TiO2 1000 cycles 300C Si_un.jpg| Temperature 300 <sup>o</sup>C, 1000 cycles. | ||
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</gallery> | </gallery> | ||
Below some SEM images of | Below some SEM images of amorphous TiO<sub>2</sub> deposited at 120 <sup>o</sup>C on Si trenches are shown. The width of the trenches is 200 nm, and the depth is 4 µm, i.e. the aspect ratio is 1:20. The number of cycles is 500, and this results in a TiO<sub>2</sub> layer of about 25 nm. From the SEM images it is seen that the TiO<sub>2</sub> layer covers the trenches very well. | ||
<gallery caption=" | <gallery caption="Amorphous titanium dioxide deposited on Si trenches" widths="250px" heights="180px" perrow="3"> | ||
image:SEM-TiO2-120C-1.jpg| | image:SEM-TiO2-120C-1.jpg| | ||
image:SEM-TiO2-120C-2.jpg| | image:SEM-TiO2-120C-2.jpg| | ||
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</gallery> | </gallery> | ||
Below some SEM images of | Below some SEM images of anatase TiO<sub>2</sub> deposited at 300 <sup>o</sup>C on Si trenches are shown. The width of the trenches is 200 nm, and the depth is 4 µm, i.e. the aspect ratio is 1:20. The number of cycles is 500, and this results in a TiO<sub>2</sub> layer of about 26 nm. From the SEM images it is seen that the TiO<sub>2</sub> layer covers the trenches very well. | ||
<gallery caption=" | <gallery caption="Anastase titanium dioxide deposited on Si trenches" widths="250px" heights="180px" perrow="3"> | ||
image:TiO2 trenches-300C-1.jpg| | image:TiO2 trenches-300C-1.jpg| | ||
image:TiO2 trenches-300C-2.jpg| | image:TiO2 trenches-300C-2.jpg| | ||
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XPS measurements of TiO<sub>2</sub> deposited at 120 <sup>o</sup>C and 300 <sup>o</sup>C are shown below. From the XPS measurements it can be calculated that at temperaturs below 120 <sup>o</sup>C the TiO<sub>2</sub> layer will be contaminated with about 1-3 % chlorine molecules from the TiCl<sub>4</sub> precursor. This can be also seen as small white dots in SEM images of the anatase TiO<sub>2</sub> layers above. | XPS measurements of TiO<sub>2</sub> deposited at 120 <sup>o</sup>C and 300 <sup>o</sup>C are shown below. From the XPS measurements it can be calculated that at temperaturs below 120 <sup>o</sup>C the TiO<sub>2</sub> layer will be contaminated with about 1-3 % chlorine molecules from the TiCl<sub>4</sub> precursor. This can be also seen as small white dots in SEM images of the anatase TiO<sub>2</sub> layers above. | ||
[[image:XPS_TiO2.jpg|320x320px|left|thumb|XPS measurements of titanium dioxide]] | [[image:XPS_TiO2.jpg|320x320px|left|thumb|XPS measurements of titanium dioxide.]] | ||