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Specific Process Knowledge/Lithography/EBeamLithographyManual: Difference between revisions

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== Rough estimation of exposure time ==
== Rough estimation of exposure time ==
[[File:currentbeamsize.jpg|400px|right]]


Based on the equations above, a rough estimate of the exposure time is easily calcualted. In the second sheet of the e-beam logbook, a simple program for calculating the scan speed frequency and an estimation of the exposure time can be found. Note, that the actual writing time will exceed the exposure-time, as the exposure-time calculation doesn’t include pre-calibrations and stage movement during exposure.
Based on the equations above, a rough estimate of the exposure time is easily calcualted. In the second sheet of the e-beam logbook, a simple program for calculating the scan speed frequency and an estimation of the exposure time can be found. Note, that the actual writing time will exceed the exposure-time, as the exposure-time calculation doesn’t include pre-calibrations and stage movement during exposure.
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The machine has a number of objective apertures (no. 15 on above illustration) in order to obtain different beam diameters in different current ranges. The available apertures are:
The machine has a number of objective apertures (no. 15 on above illustration of the column) in order to obtain different beam diameters in different current ranges. The available apertures are:


   
   


The beam diameter changes as a function of aperture size and beam current. Simulated beam diameter in the current range 0.01-1000 nA for the available aperture sizes is plotted in the graph below.
The beam diameter changes as a function of aperture size and beam current.  
 
 
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= Mounting of chips or wafers into cassette =
= Mounting of chips or wafers into cassette =