Specific Process Knowledge/Lithography/Coaters/Spin Coater: Gamma UV processing: Difference between revisions
Appearance
| Line 335: | Line 335: | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|1. | |1.??? | ||
|0.4% | |0.4% | ||
|27/3 2015 | |27/3 2015 | ||
| Line 347: | Line 347: | ||
*'''(3620) DCH 150mm 5214E 2.2um''' | *'''(3620) DCH 150mm 5214E 2.2um''' | ||
*'''(3621) DCH 150mm 5214E 2.2um HMDS''' | *'''(3621) DCH 150mm 5214E 2.2um HMDS''' | ||
Spin-off: | Spin-off: 2100 rpm. | ||
{|border="1" cellspacing="0" cellpadding="3" style="text-align:left;" | {|border="1" cellspacing="0" cellpadding="3" style="text-align:left;" | ||
| Line 363: | Line 363: | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|2. | |2.201 µm | ||
|0. | |0.5% | ||
| | |20/3 2015 | ||
|taran | |taran | ||
|4" wafer, no HMDS. 9 points on one wafer, exclusion zone 5mm | |4" wafer, no HMDS. 9 points on one wafer, exclusion zone 5mm | ||
| Line 393: | Line 393: | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Silicon with native oxide | |Silicon with native oxide | ||
|4. | |4.194 µm | ||
|0.5% | |||
|20/3 2015 | |||
|taran | |||
|6" wafer, no HMDS. 13 points on one wafer, exclusion zone 5mm | |||
|- | |||
|-style="background:WhiteSmoke; color:black" | |||
|Silicon with native oxide | |||
|4.171 µm | |||
|0.7% | |0.7% | ||
| | |20/3 2015 | ||
|taran | |taran | ||
|4" wafer, no HMDS. 9 points on one wafer, exclusion zone 5mm | |4" wafer, no HMDS. 9 points on one wafer, exclusion zone 5mm | ||
|} | |} | ||