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==Disco Automatic dicing saw, model DAD321==
[[Image:Disco_DAD_321_Dicer.jpg|300x300px|thumb|Dicer positioned on 1. floor bldg 346 room|right]]
[[Image:Disco_DAD_321_Dicer.jpg|300x300px|thumb|Dicer positioned on 1. floor bldg 346 room|right]]


Disco Automatic dicing saw, model DAD321


The dicer feature versatile processing capabilities, compact designs, and high precision and reliability. Users perform workpiece loading, alignment, and unloading manually.
The dicer feature versatile processing capabilities, compact designs, and high precision and reliability. Users perform workpiece loading, alignment, and unloading manually.
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==Overview of dicing paramters for different materials==




[[Image:Dicetest_001.jpg|300x300px|thumb|test|left]]
[[Image:Dicetest_001.jpg|300x300px|thumb|test|left]]

Revision as of 15:00, 19 February 2008

Disco Automatic dicing saw, model DAD321

Dicer positioned on 1. floor bldg 346 room


The dicer feature versatile processing capabilities, compact designs, and high precision and reliability. Users perform workpiece loading, alignment, and unloading manually.

The dicer at DANCHIP is placed in room ?? on the first floor in bldg. 346. Please notice that this is not a cleanroom and that the dicingproces is very dirty. Think about how to clean your samples if you want to bring them back in the cleanroom.

The dicer can handle up to 6” wafers and 160x160 mm square samples and has a 192 mm cutting range.


A rough overview of the performance Disco DAD321 Dicer

Purpose Equipment for dicing out samples.
  • Pure Silicon samples
  • Silicon bonded to Silicon
  • Silicon bonded to Pyrex/Borofloat
  • Pyrex/Borofloat
Performance Scan range xy

Line scan x: 50 µm to 200 mm

. Scan range z

50 Å to 262 µm

. Resolution xy

down to 0.067 µm

. Resolution z

1Å, 10Å or 20Å

. Max. scan depth as a function of trench width W

1.2(W[µm]-5µm)

Hardware settings Tip radius
  • 5 µm 45o cone
Substrates Substrate size
  • up to 8"
. Substrate material allowed
  • In principle all materials




Overview of dicing paramters for different materials

test