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Specific Process Knowledge/Back-end processing/Disco Saw: Difference between revisions

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!style="background:silver; color:black;" align="left"|Purpose  
!style="background:silver; color:black;" align="left"|Purpose  
|style="background:LightGrey; color:black"|Equipment for dicing out samples.||style="background:WhiteSmoke; color:black"|
|style="background:LightGrey; color:black"|Equipment for dicing out samples.||style="background:WhiteSmoke; color:black"|
*Single point profiles
*Pure Silicon samples
*Wafer mapping
*Silicon bonded to Silicon
*Stress measurements by measuring wafer bow
*Silicon bonded to Pyrex/Borofloat
*Surface roughness on a line scan
*Pyrex/Borofloat
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!style="background:silver; color:black" align="left"|Performance
!style="background:silver; color:black" align="left"|Performance