Specific Process Knowledge/Etch/Etching of Bulk Glass: Difference between revisions
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New page: 40% HF 3µm/min Beaker Maske? Beskrives en hel process. |
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Beskrives en hel process. | Beskrives en hel process. | ||
==Comparison of wet Silicon Oxide etch and dry etches (RIE and AOE) etch for etching of Silicon Oxide== | |||
{| border="2" cellspacing="0" cellpadding="4" align="center" | |||
! | |||
! Wet Silicon Oxide etch (BHF and SIO Etch (wetting agent)) | |||
! RIE | |||
! AOE | |||
|- valign="top" | |||
|'''General description''' | |||
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*Isotropic etch | |||
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*Anisotropic etch: vertical sidewalls | |||
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*Anisotropic etch: vertical sidewalls, especially good for deep etch and high aspect ratio etch | |||
|-valign="top" | |||
|'''Possible masking materials''' | |||
| | |||
*Photoresist | |||
*Silicon nitride | |||
| | |||
*Photoresist | |||
*(Poly)Silicon | |||
*Aluminium | |||
*Chromium (ONLY RIE2!) | |||
*Other metals that covers less the 5% of the wafer area (ONLY RIE2!) | |||
| | |||
*Photoresist | |||
*(Poly)Silicon | |||
*Aluminium | |||
|- valign="top" | |||
|'''Etch rate''' | |||
| | |||
*~75 nm/min (Thermal oxide) in BHF | |||
*~90 nm/min (Thermal oxide) in SIO Etch | |||
| | |||
*Typically 40-120 nm/min can be increased or decreased by using other recipe parameters. | |||
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*Typically 200-600 nm/min can be increased or decreased by using other recipe parameters. | |||
|-valign="top" | |||
|'''Batch size''' | |||
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*1-25 wafers at a time | |||
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*1 wafer at a time | |||
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*1 wafer at a time | |||
|-valign="top" | |||
|'''Size of substrate''' | |||
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*4" wafers | |||
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*4" wafers or smaller pieces | |||
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*6" or 4" depending on the setup (smaller pieces if you have a carrier wafer) | |||
|-valign="top" | |||
|'''Allowed materials''' | |||
| | |||
*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*Blue film | |||
*Gold (Au) and Nickel (Ni) (but only in BHF2 (KOH)!) | |||
| | |||
*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*E-beam resist | |||
*Aluminium | |||
*Chromium (ONLY RIE2!) | |||
*Other metals that covers less the 5% of the wafer area (ONLY RIE2!) | |||
| | |||
*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*E-beam resist | |||
*Aluminium | |||
|- | |||
|} | |||
Revision as of 09:28, 11 March 2008
40% HF 3µm/min Beaker Maske?
Beskrives en hel process.
Comparison of wet Silicon Oxide etch and dry etches (RIE and AOE) etch for etching of Silicon Oxide
| Wet Silicon Oxide etch (BHF and SIO Etch (wetting agent)) | RIE | AOE | |
|---|---|---|---|
| General description |
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| Possible masking materials |
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| Etch rate |
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|
| Batch size |
|
|
|
| Size of substrate |
|
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|
| Allowed materials |
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