Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
Appearance
| Line 35: | Line 35: | ||
==Comparison of optical microscope, optical profiler, SEM, AFM and stylus profiler for sample imaging== | ==Comparison of optical microscope, optical profiler, SEM, AFM and stylus profiler for sample imaging== | ||
{|border="1" cellspacing="1" cellpadding=" | {|border="1" cellspacing="1" cellpadding="1" style="text-align:left;" | ||
|- | |- | ||