Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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!Vertical resolution | !Vertical resolution | ||
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| | |Confocal measurements: | ||
*10x objective: <50 nm | *10x objective: <50 nm | ||
*50x objective, NA 0.95: <1 nm | *50x objective, NA 0.95: <1 nm | ||