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Specific Process Knowledge/Lithography/CSAR: Difference between revisions

Tigre (talk | contribs)
Tigre (talk | contribs)
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! rowspan="13" align="center"| Recipe
! rowspan="13" align="center"| Recipe
| rowspan="4"| Deposition step
| rowspan="4"  width ="50"| Deposition step
|Time
|Duration
|2.5 s
|2.5 s
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| Gasses
| width ="30"| Gasses
|C<sub>4</sub>F<sub>8</sub> 50 sccm, SF<sub>6</sub> 0 sccm
|C<sub>4</sub>F<sub>8</sub> 50 sccm, SF<sub>6</sub> 0 sccm
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| rowspan="4"| Etch step (boost)
| rowspan="4"| Etch step (boost)
|Time
|Duration
|1.5 s
|1.5 s
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| rowspan="4"| Etch step (main)
| rowspan="4"| Etch step (main)
|Time
|Duration
|3.5 s
|3.5 s
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|Platen temperature
|Platen temperature
|20 °C
|colspan="2"|20 °C
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! rowspan="1" align="center"| Conditions
! rowspan="1" align="center"| Conditions
| Conditioning
| Conditioning
| Pre-clean: 10 min oxygen clean
|colspan="2"| Pre-clean: 10 min oxygen clean
5 min oxygen clean between runs
5 min oxygen clean between runs
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! rowspan="2" align="center"| Etch rates  
! rowspan="2" align="center"| Etch rates  
| Si
| Si
|  
|colspan="2"|  
500 nm lines:  nm/min <br>
500 nm lines:  nm/min <br>
190 nm lines:  nm/min <br>
190 nm lines:  nm/min <br>
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|CSAR
|CSAR
|  nm/min
|colspan="2"|  nm/min
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