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Specific Process Knowledge/Etch/Wet Polysilicon Etch: Difference between revisions

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!  
!  
! Nitride etch @ 180 <sup>o</sup>C
! Nitride etch @ 180 <sup>o</sup>C
! Nitride etch @ 160 <sup>o</sup>C
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|-  
|General description
|General description
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Etch/strip of silicon nitride
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Etch/strip of silicon nitride
Etch/strip of silicon nitride
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|Chemical solution
|Chemical solution
|H<sub>3</sub>PO<sub>4</sub>    (85 wt%)
|H<sub>3</sub>PO<sub>4</sub>    (85 wt%)
|H<sub>3</sub>PO<sub>4</sub>    (85 wt%)
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|Process temperature
|Process temperature
|180 <sup>o</sup>C
|180 <sup>o</sup>C
|160 <sup>o</sup>C
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|Possible masking materials:
|Possible masking materials:
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*Thermal oxide (converted si-rich surface)
*LPCVD-oxide (TEOS)
*PECVD-oxide
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*Thermal oxide (converted si-rich surface)
*Thermal oxide (converted si-rich surface)
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*~30 Å/min (annealed si-rich Si<sub>3</sub>N<sub>4</sub>)
*~30 Å/min (annealed si-rich Si<sub>3</sub>N<sub>4</sub>)
*~4 Å/min (Thermal oxide)
*~4 Å/min (Thermal oxide)
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*~26 Å/min (si-rich Si<sub>3</sub>N<sub>4</sub>)
*~? Å/min (Thermal oxide)
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|Batch size
|Batch size
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1-25 wafers at a time
1-25 wafers at a time
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1-25 wafer at a time
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|Size of substrate
|Size of substrate
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2-6" wafers
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2-6" wafers
2-6" wafers
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