Specific Process Knowledge/Etch/Wet Polysilicon Etch: Difference between revisions

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HNO<sub>3</sub> : BHF : H<sub>2</sub>O                                      20 : 1 : 20
HNO<sub>3</sub> : BHF : H<sub>2</sub>O                                      20 : 1 : 20


bainitially 85 wt% H<sub>3</sub>PO<sub>4</sub> which is heated up to the boiling temperature - ca. 157 <sup>o</sup>C. Water is allowed to boil off thus raising the concentration and the boiling temperature of the solution until a boiling temperature of 180 <sup>o</sup>C is reached. Thereafter, the wafers are submerged into the bath and the water-cooled lid is closed to maintain the concentration and the boiling temperature. In some cases a lower boiling temperature is chosen - typically 160 <sup>o</sup>C - which lowers the etch rate and improves the selectivity R<sub>Si<sub>3</sub>N<sub>4</sub></sub> / R<sub>SiO<sub>2</sub></sub>.


 
===Poly Etch data===
'''NB: Great care has to be taken in this process due to risk of "shock-boiling" '''
 
 
 
===Nitride etch - key facts===


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Revision as of 12:58, 30 January 2008

Wet Poly Etch

Wet PolySilicon Etch (in the middle): positioned in cleanroom 4

The wet Poly Etch is an isotropic silicon etch. This holds for both a poly-silicon thin-film as well as single-crystalline material such as a Si(100) surface. The Poly Etch process is placed in a dedicated PP-tank in a laminar-flow bench in cleanroom 4.

The Poly Etch is typically used for opening holes in poly-silicon thin-films, using photoresist as an etch mask. Due to its isotropic nature the under-etching (etch-bias) at least amounts to the thickness of the poly-silicon layer. Another example of usage is etching of "circular-shaped" holes in silicon substrates.

The Poly Etch is based on the combined oxidation of silicon followed by dissolution of the silicon oxide. The etch solution consists of:

HNO3 : BHF : H2O 20 : 1 : 20


Poly Etch data

Nitride etch @ 180 oC Nitride etch @ 160 oC
General description

Etch/strip of silicon nitride

Etch/strip of silicon nitride

Chemical solution H3PO4 (85 wt%) H3PO4 (85 wt%)
Process temperature 180 oC 160 oC
Possible masking materials:
  • Thermal oxide (converted si-rich surface)
  • LPCVD-oxide (TEOS)
  • PECVD-oxide
  • Thermal oxide (converted si-rich surface)
  • LPCVD-oxide (TEOS)
  • PECVD-oxide
Etch rate
  • ~85 Å/min (stoichiometric Si3N4)
  • ~60 Å/min (si-rich Si3N4)
  • ~30 Å/min (annealed si-rich Si3N4)
  • ~4 Å/min (Thermal oxide)
  • ~26 Å/min (si-rich Si3N4)
  • ~? Å/min (Thermal oxide)
Batch size

1-25 wafers at a time

1-25 wafer at a time

Size of substrate

2-6" wafers

2-6" wafers