Specific Process Knowledge/Thermal Process/Annealing: Difference between revisions
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! General description | ! General description | ||
|Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for | |Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for oxidation.||Drive-in of phosphorous deposited in the phosphorous pre-dep furnace(A2) or drive-in of ion implanted phosphorous. Can also be used for oxidation.||Oxidation of gate-oxide and other especially clean oxides. At the moment also used for general annealing and oxidation of 6" wafers.||Annealing and oxidation of wafers from the B-stack and PECVD1.||Annealing and oxidation of wafers from NIL.||Annealing of wafers with aluminium.||Annealing and oxidation of any material.||Rapid thermal annealing. | ||
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! | ! Annealing with N<math>_2</math> | ||
|x||x||x (with special permission)||x||x||x||x||x | |x||x||x (with special permission)||x||x||x||x||x | ||
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!Wet annealing with bubler (water steam + | !Wet annealing with bubler (water steam + N<math>_2</math>) | ||
||||| | |.||.||.||x||x||.||.||. | ||
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!Process temperature | !Process temperature [ <sup>o</sup>C ] | ||
|800-1150||800-1150||800-1150||800-1150||800-1150||800-1150||22-1000<sup>o</sup>C||? | |||
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! Batch size | ! Batch size | ||
|max. 30 wafers of 4" or 2"||max. 30 4" wafers or 2" wafers||max. 30 wafers of 6",4" or 2"||max. 30 4" wafers or 2" wafers||max. 30 4" wafers or 2" wafers||max. 30 4" wafers or 2" wafers|| | |max. 30 wafers of 4" or 2"||max. 30 4" wafers or 2" wafers||max. 30 wafers of 6",4" or 2"||max. 30 4" wafers or 2" wafers||max. 30 4" wafers or 2" wafers||max. 30 4" wafers or 2" wafers||30x4" or small pieces||? | ||
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!style="background:#f0f0f0;"|Which wafers are allowed to enter the furnace: | !style="background:#f0f0f0;"|Which wafers are allowed to enter the furnace: | ||
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| align="center" style="background:#f0f0f0;"|'''C3 Anneal bond''' | | align="center" style="background:#f0f0f0;"|'''C3 Anneal bond''' | ||
| align="center" style="background:#f0f0f0;"|'''C4 Anneal aluminium''' | | align="center" style="background:#f0f0f0;"|'''C4 Anneal aluminium''' | ||
| align="center" style="background:#f0f0f0;"|'''Nobel | | align="center" style="background:#f0f0f0;"|'''Nobel''' | ||
| align="center" style="background:#f0f0f0;"|'''RTP''' | | align="center" style="background:#f0f0f0;"|'''RTP''' | ||
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| RCA clean** Si wafers with no history of Metals on||x||x||x (with special permission)||x||x||x||x||x | | RCA clean** Si wafers with no history of Metals on||x||x||x (with special permission)||x||x||x||x||x | ||
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| From Predep furnace directly (e.g. incl. Predep HF**)||From A2||From A4|||||||||||| | | From Predep furnace directly (e.g. incl. Predep HF**)||From A2||From A4||.||x||x||x||x||x | ||
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| Wafers directly from PECVD1||||||||x||x||x||x||x | | Wafers directly from PECVD1||.||.||.||x||x||x||x||x | ||
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| Wafers directly from NIL bonding||||||||||x||x||x||x | | Wafers directly from NIL bonding||.||.||.||.||x||x||x||x | ||
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|Wafers with aluminium | |Wafers with aluminium||.||.||.||.||.||x||x||. | ||
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|wafers with other metals||||||||||||||x|| | |wafers with other metals||.||.||.||.||.||.||x||. | ||
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|wafers with III-V materials||||||||||||||||x | |wafers with III-V materials||||||||||||||||x |
Revision as of 12:07, 30 January 2008
Annealing
At Danchip we have seven furnaces and an RTP for annealing: A1,A3,C1,C2,C3,C4, noble furnace and RTP. Annealing normally takes place in an N atmosphere. PECVD PBSG is annealed in an wet atmosphere which will also oxidize the silicon substrate.
- Anneal with N can be done in furnaces:A1,A3,C1,C2,C3,C4, noble furnace and RTP
- Wet anneal with HO in a bubbler can be done in furnaces:C2 and C3.
Comparing the seven annealing equipments
' | A1 Boron drive-in | A3 Phosphorous drive-in | C1 Gate oxide | C2 Anneal oxide | C3 Anneal bond | C4 Anneal aluminium | Nobel furnace | RTP |
General description | Drive-in of boron deposited in the boron pre-dep furnace(A2) or drive-in of ion implanted boron. Can also be used for oxidation. | Drive-in of phosphorous deposited in the phosphorous pre-dep furnace(A2) or drive-in of ion implanted phosphorous. Can also be used for oxidation. | Oxidation of gate-oxide and other especially clean oxides. At the moment also used for general annealing and oxidation of 6" wafers. | Annealing and oxidation of wafers from the B-stack and PECVD1. | Annealing and oxidation of wafers from NIL. | Annealing of wafers with aluminium. | Annealing and oxidation of any material. | Rapid thermal annealing. |
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Annealing with N | x | x | x (with special permission) | x | x | x | x | x |
Wet annealing with bubler (water steam + N) | . | . | . | x | x | . | . | . |
Process temperature [ oC ] | 800-1150 | 800-1150 | 800-1150 | 800-1150 | 800-1150 | 800-1150 | 22-1000oC | ? |
Batch size | max. 30 wafers of 4" or 2" | max. 30 4" wafers or 2" wafers | max. 30 wafers of 6",4" or 2" | max. 30 4" wafers or 2" wafers | max. 30 4" wafers or 2" wafers | max. 30 4" wafers or 2" wafers | 30x4" or small pieces | ? |
Which wafers are allowed to enter the furnace: | A1 Boron drive-in | A3 Phosphorous drive-in | C1 Gate oxide | C2 Anneal oxide | C3 Anneal bond | C4 Anneal aluminium | Nobel | RTP |
New clean* Si wafers 4" (6" in C1) | x | x | x (with special permission) | x | x | x | x | x |
RCA clean** Si wafers with no history of Metals on | x | x | x (with special permission) | x | x | x | x | x |
From Predep furnace directly (e.g. incl. Predep HF**) | From A2 | From A4 | . | x | x | x | x | x |
Wafers directly from PECVD1 | . | . | . | x | x | x | x | x |
Wafers directly from NIL bonding | . | . | . | . | x | x | x | x |
Wafers with aluminium | . | . | . | . | . | x | x | . |
wafers with other metals | . | . | . | . | . | . | x | . |
wafers with III-V materials | x |
*New clean: only right from the new clean box. It is not allowed to put them in another box first.
**These wafers must be placed in a "transport box from RCA to furnace" using the RCA carrier when doing RCA or the pre-dep carrier after pre-dep.