Specific Process Knowledge/Etch/DryEtchProcessing: Difference between revisions
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! rowspan="2" style="background:silver; color:black" width="60" |Purpose | ! rowspan="2" style="background:silver; color:black" width="60" |Purpose | ||
! style="background:WhiteSmoke; color:black" | Primary uses | ! style="background:WhiteSmoke; color:black" width="60" | Primary uses | ||
| style="background:WhiteSmoke; color:black"| The RIE chamber for etching of: | | style="background:WhiteSmoke; color:black"| The RIE chamber for etching of: | ||
* silicon | * silicon |
Revision as of 14:50, 25 September 2014
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Challenges and techniques common to all dry etch tools
This page contains information that is common to dry etch instruments.
Hardware and option comparison of the dry etchers at Danchip
The table below compares the hardware and the options.
RIE2 | ASE | AOE | DRIE-Pegasus | ICP Metal etch | III-V RIE | III-V ICP | ||||||||||||||||||||||||||||||||||||||||||||||
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Purpose | Primary uses | The RIE chamber for etching of:
The users are allowed to have 5% metal exposed to the plasma |
Formerly the primary silicon etcher; now polymers may also be etched | Etching of silicon oxides or nitrides | Silicon etching | Standard recipes for etching of Al, Cr and Ti, now also etches of W, TiW and Mo | Etching of silicon oxide, resist, BCB, silicon nitride, InP, InGaAs and GaAs on III-V substrates | Etching of III-V materials such as GaN, InP/InGaAsP/InGaAs, AlGaAs, GaAs | ||||||||||||||||||||||||||||||||||||||||||||
Alternative/backup uses | Shallow silicon etches | Backup silicon etcher | Barc etch | Silicon etcher | ||||||||||||||||||||||||||||||||||||||||||||||||
General description | Plasma source | Parallel plate capacitor setup with RF power between the two electrodes | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Inductively coupled plasma chamber with two RF generators; the coil (with outer and inner coil) and platen generator | Inductively coupled plasma chamber with two RF generators; the coil and platen generator | Parallel plate capacitor setup with RF power between the two electrodes | Inductively coupled plasma chamber with two RF generators; the coil and platen generator
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Substrate cooling/temperature | The electrode is oil cooled: Fixed at 20oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 20oC | The electrode is oil cooled. Also, Helium backside cooling: -10oC to 60oC | The electrode is oil cooled. Also, Helium backside cooling: 0oC to 50oC | The electrode is oil cooled. Also, Helium backside cooling: -20oC to 30oC | The electrode is oil cooled: Fixed at 20oC | The electrode is oil cooled with a special chiller. Also, Helium backside cooling: 20oC to 180oC | |||||||||||||||||||||||||||||||||||||||||||||
Clamping | No clamping | Electrostatic clamping (semco electrode) | Electrostatic clamping (TDESC) | Electrostatic clamping (TDESC) | Electrostatic clamping (TDESC) | No clamping | Mechanical clamping (weighted clamp with ceramic fingers) | |||||||||||||||||||||||||||||||||||||||||||||
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RF generators |
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Substrate loading | Loading via cluster 2 load lock | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock | Loading via dedicated two-slot carousel load lock or via atmospheric cassette loader | Loading via dedicated two-slot carousel load lock | Manual loading directly into process chamber | Loading via dedicated two-slot carousel load lock | |||||||||||||||||||||||||||||||||||||||||||||
Options | Optical endpoint detector at fixed wavelength |
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Allowed materials |
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