Specific Process Knowledge/Etch/Wet Silicon Nitride Etch: Difference between revisions
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*PECVD-oxide | *PECVD-oxide | ||
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*Thermal oxide (converted si-rich surface) | |||
*LPCVD-oxide (TEOS) | |||
*PECVD-oxide | |||
|- | |- | ||
|Etch rate | |Etch rate | ||
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~ | *~84 Å/min (stoichiometric Si<sub>3</sub>N<sub>4</sub>) | ||
*~84 Å/min (stoichiometric Si<sub>3</sub>N<sub>4</sub>) | |||
*~84 Å/min (stoichiometric Si<sub>3</sub>N<sub>4</sub>) | |||
| | | | ||
~(??) nm/min | ~(??) nm/min | ||