Specific Process Knowledge/Etch/Wet Silicon Nitride Etch: Difference between revisions
Appearance
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|- | |- | ||
|Process temperature | |Process temperature | ||
| | |180 <sup>o</sup>C | ||
| | |160 <sup>o</sup>C | ||
|- | |- | ||
| Line 38: | Line 38: | ||
|Possible masking materials: | |Possible masking materials: | ||
| | | | ||
Thermal oxide (converted si-rich surface) | |||
LPCVD-oxide (TEOS) | |||
PECVD-oxide | |||
| | | | ||
Photoresist (1.5 µm AZ5214E) | Photoresist (1.5 µm AZ5214E) | ||