Specific Process Knowledge/Lithography/CSAR: Difference between revisions
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!colspan=" | !colspan="4"|Wafer 4.09, 30 nm exposed pattern, shot pitch 5 nm | ||
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| [[File:53nmCSAR30nmOverviewBasedose-5%.png|250px]] | | [[File:53nmCSAR30nmOverviewBasedose-5%.png|250px]] | ||
| [[File:53nmCSAR30nmLinesBasedose-5%.png|250px]] | | [[File:53nmCSAR30nmLinesBasedose-5%.png|250px]] | ||
| [[File:30nmShot10.png|250px]] | |||
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| [[File:53nmCSAR30nmOverviewBasedose.png|250px]] | | [[File:53nmCSAR30nmOverviewBasedose.png|250px]] | ||
| [[File:53nmCSAR30nmLinesBasedose.png|250px]] | | [[File:53nmCSAR30nmLinesBasedose.png|250px]] | ||
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| [[File:53nmCSAR30nmOverviewBasedose+5%.png|250px]] | | [[File:53nmCSAR30nmOverviewBasedose+5%.png|250px]] | ||
| [[File:53nmCSAR30nmLinesBasedose+5%.png|250px]] | | [[File:53nmCSAR30nmLinesBasedose+5%.png|250px]] | ||
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