Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions

Revision as of 09:13, 5 September 2014 view source Bghe (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators 7,317 edits →Ellipsometer VASE and Ellipsometer M-2000V ← Older edit		Revision as of 08:57, 11 March 2015 view source Thes (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators 209 edits →Ellipsometer VASE and Ellipsometer M-2000V Newer edit →
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	Ellipsometry is an indirect measurement so a model has to be fit to the data in order to obtain the film thickness and optical constants. To learn more about ellipsometry you can take a look at the [http://www.jawoollam.com/tutorial_1.html tutorial] provided by the J. A. Woollam Co.		Ellipsometry is an indirect measurement so a model has to be fit to the data in order to obtain the film thickness and optical constants. To learn more about ellipsometry you can take a look at the [http://www.jawoollam.com/tutorial_1.html tutorial] provided by the J. A. Woollam Co.

	Access to use the CompleteEASE software can be found using Remote Desktop connection to: 10.51.40.00 (or DCHP-D0037.win.dtu.dk)		Access to use the CompleteEASE software can be found using Remote Desktop connection to: 10.51.40.99 (or DCHP-D0037.win.dtu.dk)