Specific Process Knowledge/Thin film deposition/Furnace LPCVD PolySilicon: Difference between revisions

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!style="background:silver; color:black;" align="left"|Purpose  
!style="background:silver; color:black;" align="left"|Purpose  
|style="background:LightGrey; color:black"|Deposition of silicon nitride ||style="background:WhiteSmoke; color:black"|Stoichiometry:
|style="background:LightGrey; color:black"|Deposition of silicon nitride  
|style="background:WhiteSmoke; color:black"|Stoichiometry:
*Si<sub>3</sub>N<sub>4</sub>
*Si<sub>3</sub>N<sub>4</sub>
*SRN
*SRN
SRN: Silicon Rich Nitride
SRN: Silicon Rich Nitride
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!style="background:silver; color:black" align="left"|Performance
!style="background:silver; color:black" align="left" valign="top" rowspan="3"|Performance
|style="background:LightGrey; color:black"|Film thickness||style="background:WhiteSmoke; color:black"|
|style="background:LightGrey; color:black"|Film thickness
|style="background:WhiteSmoke; color:black"|
*Si<sub>3</sub>N<sub>4</sub>:~50Å - ~3000Å
*Si<sub>3</sub>N<sub>4</sub>:~50Å - ~3000Å
*SRN: ~50Å - ~10000Å
*SRN: ~50Å - ~10000Å
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|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Step coverage
|style="background:LightGrey; color:black"|Step coverage
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Good
*Good
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|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Film quality
|style="background:LightGrey; color:black"|Film quality
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Dense film
*Dense film
*Few defects
*Few defects
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!style="background:silver; color:black" align="left"|Process parameter range
!style="background:silver; color:black" align="left" valign="top" rowspan="3"|Process parameter range
|style="background:LightGrey; color:black"|Process Temperature
|style="background:LightGrey; color:black"|Process Temperature
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*800-835 <sup>o</sup>C
*800-835 <sup>o</sup>C
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|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Process pressure
|style="background:LightGrey; color:black"|Process pressure
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*80-230 mTorr
*80-230 mTorr
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|-
|style="background:silver; color:black"|.||style="background:LightGrey; color:black"|Gas flows
|style="background:LightGrey; color:black"|Gas flows
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*SiH<math>_2</math>Cl<math>_2</math>:10-100 sccm
*SiH<math>_2</math>Cl<math>_2</math>:10-100 sccm
*NH<math>_3</math>:10-75 sccm
*NH<math>_3</math>:10-75 sccm
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!style="background:silver; color:black" align="left"|Substrates
!style="background:silver; color:black" align="left" valign="top" rowspan="2"|Substrates
|style="background:LightGrey; color:black"|Batch size
|style="background:LightGrey; color:black"|Batch size
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
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*Deposition on both sides of the substrate
*Deposition on both sides of the substrate
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|style="background:silver; color:black"|.|| style="background:LightGrey; color:black"|Substrate material allowed
| style="background:LightGrey; color:black"|Substrate material allowed
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*Silicon wafers (new from the box or RCA cleaned)
*Silicon wafers (new from the box or RCA cleaned)

Revision as of 15:02, 7 May 2008

Ikke skrevet!

LPCVD (Low Pressure Chemical Vapor Deposition) PolySilicon

A4 Furnace PolySilicon: positioned in cleanroom 2

At the moment there is one furnace for PolySilicon depositions at Danchip. The furnace is a Tempress horizontal furnace. The process is a batch process meaning you can run a batch of 25 wafers at a time. The deposition takes place at temperatures of 800-835 degrees Celsius. The reactive gases are Ammonia and dichlorsilane. The LPCVD nitride has a good step coverage and the film thickness is very uniform over the wafer. We have two standard LPCVD nitride processes: One for depositing stoichiometric nitride (Si3N4) and one for deposition of low stress nitride (SNR). To get information on how to operate the furnace please read the manual which is uploaded to LabManager.

Process Knowledge

Please take a look at the process side for deposition of Silicon Nitride using LPCVD: Deposition of Silicon Nitride using LPCVD


A rough overview of the performance of LPCVD Silicon Nitride and some process related parameters

Purpose Deposition of silicon nitride Stoichiometry:
  • Si3N4
  • SRN

SRN: Silicon Rich Nitride

Performance Film thickness
  • Si3N4:~50Å - ~3000Å
  • SRN: ~50Å - ~10000Å
Step coverage
  • Good
Film quality
  • Dense film
  • Few defects
Process parameter range Process Temperature
  • 800-835 oC
Process pressure
  • 80-230 mTorr
Gas flows
  • SiHCl:10-100 sccm
  • NH:10-75 sccm
Substrates Batch size
  • 1-25 4" wafer per run
  • Deposition on both sides of the substrate
Substrate material allowed
  • Silicon wafers (new from the box or RCA cleaned)
    • with layers of silicon oxide or silicon (oxy)nitride (RCA cleaned)
  • Quartz wafers (RCA cleaned)