Specific Process Knowledge/Characterization/Element analysis: Difference between revisions

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 When a solid sample is sputtered by primary ions of few keV energy, a fraction of the particles emitted from the target is ionized. Secondary Ion Mass Spectrometry consists of analyzing these secondary ions with a mass spectrometer. Secondary ion emission by a solid surface under ion bombardment supplies information about the elemental, isotopic and molecular composition of its uppermost atomic layers.
-{| border="1" cellpadding="2"
-!width="50"|Name
-!width="225"|Effect
-!width="225"|Games Found In ple is sputtered by primary ions of few k
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-|Poké Ball || Regular Poké Ball ple is sputtered by primary ions of few k || All Versionsple is sputtered by primary ions of few k
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-|Great Ball || Better than a Poké Ball ple is sputtered by primary ions of few k || All Versions
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 |  Depth resolution
-|| The size interaction volume depends on the SEM high voltage and sample density:
+|| The size interaction volume depends on the SEM high voltage and sample density: The higher the SEM high voltage the bigger and deeper the interaction volume. The more dense the material is the smaller is the interaction volume
-  * The higher the SEM high voltage the bigger and deeper the interaction volume
-  * The more dense the material is the smaller is the interaction volume
 || Depth profiling is
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