Specific Process Knowledge/Characterization/Element analysis: Difference between revisions
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| Non destructive excitation of X-rays in the sample. | | Non destructive excitation of X-rays in the sample. The elemental analysis is possible because the energy of these photons is characteristic of the element they emitted from. | ||
| Destructive method that sputters off surface atoms with heavy ions. | | Destructive method that sputters off surface atoms with heavy ions. | ||
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