Specific Process Knowledge/Etch/Etching of Silicon Oxide: Difference between revisions
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![[Specific Process Knowledge/Etch/RIE (Reactive Ion Etch)|RIE (Reactive Ion Etch)]] | ![[Specific Process Knowledge/Etch/RIE (Reactive Ion Etch)|RIE (Reactive Ion Etch)]] | ||
![[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)|AOE (Advanced Oxide Etch)]] | ![[Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)|AOE (Advanced Oxide Etch)]] | ||
![[Specific Process Knowledge/Etch/ICP Metal Etcher|ICP metal]] | |||
![[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | ![[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300|IBE/IBSD Ionfab 300]] | ||
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*Anisotropic etch: vertical sidewalls | *Anisotropic etch: vertical sidewalls | ||
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*Anisotropic etch: almost vertical sidewalls | |||
*We prefer that SiO2 etch takes place in the AOE, since it is a very polymeric process an the ICP is not heating as much as the AOE. | |||
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*Primarily for pure physical etch by sputtering with Ar-ions | *Primarily for pure physical etch by sputtering with Ar-ions | ||
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*Aluminium | *Aluminium | ||
*Chromium (Please try to avoid this) | *Chromium (Please try to avoid this) | ||
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*Photoresist | |||
*DUV resist | |||
*E-beam resist | |||
*Si | |||
*Silicon Nitride | |||
*Aluminium | |||
*Chromium | |||
*Ti | |||
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*Any material that is accepted in the machine | *Any material that is accepted in the machine | ||
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*Process dependent | *Process dependent | ||
*Tested range: ~230nm/min - ~550nm/min | *Tested range: ~230nm/min - ~550nm/min | ||
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*Process dependent | |||
*Tested range: ~ | |||
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*Process dependent | *Process dependent | ||
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*<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | *<nowiki>#</nowiki>1 50 mm wafer fitted on a 100mm wafer | ||
*<nowiki>#</nowiki>1 100 mm wafer | *<nowiki>#</nowiki>1 100 mm wafer | ||
*<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | *<nowiki>#</nowiki>1 150 mm wafers (only when the system is set up to 150mm) | ||
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*As many small samples as can be fitted on a 150mm wafer | |||
*<nowiki>#</nowiki>1 50 mm wafer fitted on a 150mm wafer | |||
*<nowiki>#</nowiki>1 100 mm wafer fitted on a 150nm wafer | |||
*<nowiki>#</nowiki>1 150 mm wafers | |||
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*As many samples as can be securely fitted on a up to 200mm wafer | *As many samples as can be securely fitted on a up to 200mm wafer | ||
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*Aluminium | *Aluminium | ||
*Chromium (try to avoid it) | *Chromium (try to avoid it) | ||
*Quartz/fused silica | |||
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*Silicon | |||
*Silicon Oxide | |||
*Silicon Nitride | |||
*Silicon Oxynitride | |||
*Photoresist | |||
*DUV resist | |||
*E-beam resist | |||
*Aluminium | |||
*Chromium | |||
*Titanium | |||
*W | |||
*Quartz/fused silica | *Quartz/fused silica | ||
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Revision as of 09:48, 5 August 2016
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Comparing silicon oxide etch methods at Danchip
There are a broad varity of silicon oxide etch methods at Danchip. The methodes are compared here to make it easier for you to compare and choose the one that suits your needs.
- Wet Silicon Oxide Etch
- SiO2 etch using RIE2
- SiO2 etch using AOE
- IBE/IBSD Ionfab 300
- SiO2 etch using Plasma Asher (isotropic)
Compare the methods for Silicon Oxide etching
Wet Silicon Oxide etch (BHF/HF) | RIE (Reactive Ion Etch) | AOE (Advanced Oxide Etch) | ICP metal | IBE/IBSD Ionfab 300 | |
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Generel description |
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Possible masking materials |
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Etch rate range |
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Substrate size |
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Allowed materials |
In the dedicated bath:
In a plastic beaker:
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