Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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The SEM is, however, much more complicated in terms of | The SEM is, however, much more complicated in terms of | ||
* Operation: You need training and it takes some experience and skill to obtain good images. | * Operation: You need training and it takes some experience and skill to obtain good images. | ||
* Hardware: In order to work the SEM needs vacuum and sophisticated electronics. | * Hardware: In order to work the SEM needs a chamber under vacuum and sophisticated electronics. | ||
* Sample preparation and mounting: You may have to prep your sample in several ways, either coating, cleaving or mounting on specific sample holders. | * Sample preparation and mounting: You may have to prep your sample in several ways, either coating, cleaving or mounting on specific sample holders. | ||
=== The atomic force microscope === | === The atomic force microscope === | ||
The [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope]] has | The [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope]] has limited use as a sample imaging instrument. In some cases the resolution of the SEM is not enough: | ||
* Nanometer sized particles on a surface | |||
* If you need to know the exact height (z) of some surface structures. The SEM only measures lateral (x,y) distances precisely. | |||
* Surface roughness | |||