Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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Revision as of 10:59, 24 January 2008
The list of instruments for sample imaging available at Danchip includes 6 optical microscopes , three scanning electron microscopes (SEM's) and an atomic force microscope (AFM). These instruments cover a wide range of applications: Below is listed some characteristics.
| Optical microscopes | SEM | AFM | |
|---|---|---|---|
| Magnification range | 25x to 1000x | 100x to 500.000x | Maximum scanned area 90x90 µm |
| Depth of focus | Low | Very high |