Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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The list of instruments for sample imaging available at Danchip includes | The list of instruments for sample imaging available at Danchip includes 6 [[Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes]] (SEM's) and an [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope]] (AFM). These instruments cover a wide range of applications: Below is listed some characteristics. | ||
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!SEM | !SEM | ||
!AFM | !AFM | ||
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| Magnification range | | Magnification range | ||
|25x to 1000x | |||
|100x to 500.000x | |||
|Maximum scanned area 90x90 µm | |||
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|Depth of focus | |||
|A few microns | |||
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Revision as of 10:58, 24 January 2008
The list of instruments for sample imaging available at Danchip includes 6 optical microscopes , three scanning electron microscopes (SEM's) and an atomic force microscope (AFM). These instruments cover a wide range of applications: Below is listed some characteristics.
| Optical microscopes | SEM | AFM | |
|---|---|---|---|
| Magnification range | 25x to 1000x | 100x to 500.000x | Maximum scanned area 90x90 µm |
| Depth of focus | A few microns |