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Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

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The list of instruments for sample imaging available at Danchip includes a number of [[Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three  
The list of instruments for sample imaging available at Danchip includes a number of [[Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three [[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes (SEM's)]] and an [[Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy|atomic force microscope (AFM)]].
 
[[Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes (SEM)]]
 
 
and a atomic force microscopy.




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