Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions
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The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, three scanning electron microscopes (SEM) and a atomic force microscopy. | The list of instruments for sample imaging available at Danchip includes a number of [[/Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three | ||
[[/Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes (SEM)]] | |||
and a atomic force microscopy. | |||
Revision as of 16:48, 21 January 2008
The list of instruments for sample imaging available at Danchip includes a number of optical microscopes , three
scanning electron microscopes (SEM)
and a atomic force microscopy.
| Optical microscopes | SEM | AFM | Profiler | |
|---|---|---|---|---|
| Magnification range | ||||
| Depth of focus |