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Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

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The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, three scanning electron microscopes (SEM) and a atomic force microscopy.
The list of instruments for sample imaging available at Danchip includes a number of [[/Specific Process Knowledge/Characterization/Optical microscope|optical microscopes]] , three  
 
[[/Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy|scanning electron microscopes (SEM)]]
 
 
and a atomic force microscopy.
 




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