Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300: Difference between revisions
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==IBE/IBSD Ionfab 300: milling, dry etching and deposition in the same tool== | ==IBE/IBSD Ionfab 300: milling, dry etching and deposition in the same tool== | ||
[[Image:IBE_IBSD_udstyret_i_RR1.jpg| | [[Image:IBE_IBSD_udstyret_i_RR1.jpg|300x300px|thumb|IBE and IBSD: positioned in cleanroom A-1]] | ||
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<!-- give the link to the equipment info page in LabManager: --> | <!-- give the link to the equipment info page in LabManager: --> | ||
[http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach= | [http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=267 IBE/IBSD Ionfab 300+ in LabManager] | ||
==Process information== | ==Process information== |
Revision as of 08:05, 21 February 2014
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IBE/IBSD Ionfab 300: milling, dry etching and deposition in the same tool
IBE: Ion Beam Etch
IBSD: Ion Beam Sputter Deposition
This Ionfab300 from Oxford Instruments is capable of of both ion sputter etching/milling and sputter deposition. The etching/milling with Argon alone is done by pure physical sputtering of the surface. This causes redeposition on the sidewalls leaving side wall angles at typically between 70-90 degrees (often closest to 70 degrees).
The user manual and contact information can be found in LabManager:
IBE/IBSD Ionfab 300+ in LabManager
Process information
Etch
- Some general process trends
- Results from the acceptance test:
- Magnetic stack containing Ta/MnIr/NiFe
- Etch in Stainless steel with X as masking material
- Process develop
Deposition
- Results from the acceptance test:
Purpose |
|
. |
---|---|---|
Performance | Etch rates |
Typical 1-100 nm/min depending om material and process parameters |
Anisotropy |
| |
Uniformity |
| |
Process parameters | Gas flows |
Etch source:
Deposition source:
|
Substrates | Batch size |
|
Materials allowed |
| |
Possible masking material |
|