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| The technique can be used for different purposes: | | The technique can be used for different purposes: |
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| ===Elemental composition===
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| [[image:Overview spectra Labadvisor.JPG|420x420px|left|thumb|XPS spectrum of a sample consisting of the elements silicon, oxygen and carbon.]]
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| Each element give a specific "finger-print" in the XPS spectrum. The binding energy of the electrons in atoms are different for all elements, and when measuring a photoelectron spectrum over a wide range of energies, the main line from each element will be placed at a specific energy in the spectrum.
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| Here is shown a spectrum measured over the energy range 0-1350 eV, and characteristic lines from three elements (C,O and Si) are seen and indicated in the spectrum.
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| The instrument program can use this information to give an estimate of the sample composition, giving the atomic percentage of the different elements.
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