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[http://http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=276  XPS-ThermoScientific in LabManager]
[http://http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=276  XPS-ThermoScientific in LabManager]


==Elemental analysis==
The XPS instrument can be used to do elemental analysis, chemical state analysis on the sample surface or deeper down by a depth profiling. A comparison about techniques and instruments used for elemental analysis at Danchip can be found on the page [[Specific Process Knowledge/Characterization/Element analysis|Element analysis]].


The XPS technique can be used to do elemental analysis, chemical state analysis on the sample surface or do a depth profiling. See more about the different possibilities here:  
More about the different possibilities with the XPS instrument is found here:  
*[[Specific Process Knowledge/Characterization/XPS/XPS technique|XPS technique]]
*[[Specific Process Knowledge/Characterization/XPS/XPS technique|XPS technique]]
*[[Specific Process Knowledge/Characterization/XPS/XPS elemental composition|Elemental composition analysis]]
*[[Specific Process Knowledge/Characterization/XPS/XPS elemental composition|Elemental composition analysis]]
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/XPS"