Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

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			The list of instruments for sample imaging available at Danchip includes a number of optical microscopes, an AFM and three SEM's.

	~~Danchip has an extensive list of equipments for sample imaging.~~ In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced [[Specific Process Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/FEI\|FEI SEM]] that is capable of taking high magnification images of any sample or wafer.		In one end is the very basic photograph of a sample or wafer that may be taken with the digital camera using the great macro functionality (Ask a Danchip employee to borrow it). In the other is the very advanced [[Specific Process Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy/FEI\|FEI SEM]] that is capable of taking high magnification images of any sample or wafer.