Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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[[Image:Tap300Al-G-schematic.png|right|thumb|Std. tip Tap300Al-G]] | [[Image:Tap300Al-G-schematic.png|right|thumb|Std. tip Tap300Al-G]] | ||
[[Image:SSS-NCHR-AFM-tip.jpg|right|thumb|SSS-NCHR tip<br /> (Super-Sharp-Silicon)]] | [[Image:SSS-NCHR-AFM-tip.jpg|right|thumb|SSS-NCHR tip<br /> (Super-Sharp-Silicon)]] | ||
[[Image:Nanoman cantilever AR5.jpg|right|thumb|AR5-NCHR tip<br /> (Aspect | [[Image:Nanoman cantilever AR5.jpg|right|thumb|AR5-NCHR tip<br /> (Aspect Ratio 5)]] | ||
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Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | ||
==An overview of the performance of the AFM: Nanoman== | ==An overview of the performance of the AFM: Nanoman== | ||