Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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To get some product information from the vendor take a look at Bruker's homepage [http://www.bruker-axs.com/atomicforcemicroscopy.html] (Bruker acquired Veeco's AFM business in Oct. 2010) | To get some product information from the vendor take a look at Bruker's homepage [http://www.bruker-axs.com/atomicforcemicroscopy.html] (Bruker acquired Veeco's AFM business in Oct. 2010) | ||
Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | |||
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| style="background:LightGrey; color:black"|Substrate material allowed | | style="background:LightGrey; color:black"|Substrate material allowed | ||
|style="background:WhiteSmoke; color:black"|In principle all materials | |style="background:WhiteSmoke; color:black"|In principle all materials | ||
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