Specific Process Knowledge/Etch/Etching of TOPAS: Difference between revisions

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==Etching of TOPAS [[Image:section under construction.jpg|70px]]==
==Etching of TOPAS==
TOPAS is etched by an oxygen plasma in the ASE. Masking of TOPAS was achieved by photo resist or a hard mask of aluminum or silicon. Photo resist is the preferred masking material, since hard masks tends to introduce local masking due to redeposition. TOPAS can be etched at rates up to 500 nm/min, with excellent uniformity over the wafer.
TOPAS is etched by an oxygen plasma in the ASE. Masking of TOPAS was achieved by photo resist or a hard mask of aluminum or silicon. Photo resist is the preferred masking material, since hard masks tends to introduce local masking due to redeposition. TOPAS can be etched at rates up to 500 nm/min, with excellent uniformity over the wafer.



Revision as of 10:10, 25 November 2013

Etching of TOPAS

TOPAS is etched by an oxygen plasma in the ASE. Masking of TOPAS was achieved by photo resist or a hard mask of aluminum or silicon. Photo resist is the preferred masking material, since hard masks tends to introduce local masking due to redeposition. TOPAS can be etched at rates up to 500 nm/min, with excellent uniformity over the wafer.

TOPAS by khara@danchip
Parameter Slow TOPAS etch Fast TOPAS etch
O2 (sccm) 50 99
CO2 (sccm) 50 0
Pressure (mTorr) 40 40
Coil power (W) 800 720
Platen power (W) 60 60
Temperature (oC) 20 20
Etch rate (nm/min) ~350 ~500
Center-Edge uniformity 0.98 0.95

Under etching and local masking

When etching TOPAS I have in general used a hard mask material underneath my layer of photo resist, to ensure that if the resist was completely removed, a mask was still present. It is however always recomended to have a photo resist as mask, as a hard mask material will introduce roughness in unmask areas of the polymer.


Silicon hard mask Aluminum hard mask
Etch broke through the photo resist layer, and sputtered silicon have redeposited on the polymer surface, introducing local masking effects. The aluminum hard mask has been etched in the resist developer introducing poor edge definition even though the resist was not completely removed by the etch.
Etch
  • O2 flow [sccm]:50
  • CO2 flow [sccm]:50
  • Pressure [mTorr]:40
  • Coil power [W]:800
  • Platen power [W]:60
  • Temperature [°C]:20
Etch
  • O2 flow [sccm]:50
  • CO2 flow [sccm]:50
  • Pressure [mTorr]:40
  • Coil power [W]:800
  • Platen power [W]:60
  • Temperature [°C]:20