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Specific Process Knowledge/Characterization/Sample imaging: Difference between revisions

Pevo (talk | contribs)
Pevo (talk | contribs)
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|-style="background:LightGrey; color:black"
!Operation priciple
!Operation priciple
|Optical
|Light
|Optical
|Light
|Electrons
|Forces
|Contact
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|-style="background:WhiteSmoke; color:black"
!Sample information
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|Measurements of
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|-style="background:LightGrey; color:black"
!Resolution limited by
!Resolution limitations
|Objectives and wavelenght of light
|Objectives and wavelenght of light
|Objectives and pixel size on the screen
|Objectives and pixel size on the screen
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|-style="background:WhiteSmoke; color:black"
!Field of view
!Magnification
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!XY range/field of view
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|10x magnification: 1.27 × 0.995 mm. 100x magnification: 0.127 × 0.095 mm
|10x magnification: 1.27 × 0.995 mm. 100x magnification: 0.127 × 0.095 mm
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|-style="background:WhiteSmoke; color:black"
!Probe
|Light
|Light
|Electrons
|Forces
|Contact
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|-style="background:LightGrey; color:black"
!Z range
!Z range
|Dependent on the microscope
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!Working distance
!Working distance
|Few mm
|Few mm
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|Contact/tapping measurement  
|Contact/tapping measurement  
|Contact measurement
|Contact measurement
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!Sampling speed
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|-style="background:LightGrey; color:black"
|-style="background:LightGrey; color:black"
!xxx
!Sample requirements
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