Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300: Difference between revisions
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**[[/Etch slow|Etch slow: resist can be removed with acetone after etch]] | **[[/Etch slow|Etch slow: resist can be removed with acetone after etch]] | ||
**[[/IBE Si etch|Si etching using AZ-resist at masking material]] | **[[/IBE Si etch|Si etching using AZ-resist at masking material]] | ||
**[[/IBE Au etch|Au etch with Ti as masking material]] | **[[/IBE Au etch#IBE Au etch with Ti mask|Au etch with Ti as masking material]] | ||
===Deposition=== | ===Deposition=== |
Revision as of 13:32, 28 August 2013
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IBE/IBSD Ionfab 300: milling, dry etching and deposition in the same tool
IBE: Ion Beam Etch
IBSD: Ion Beam Sputter Deposition
This Ionfab300 from Oxford Instruments is capable of of both ion sputter etching/milling and sputter deposition. The etching/milling with Argon alone is done by pure physical sputtering of the surface. This causes redeposition on the sidewalls leaving side wall angles at typically between 70-90 degrees (often closest to 70 degrees).
Process information
Etch
- Some general process trends
- Results from the acceptance test:
- Magnetic stack containing Ta/MnIr/NiFe
- Etch in Stainless steel with X as masking material
- Process develop
Deposition
- Results from the acceptance test:
Purpose |
|
. |
---|---|---|
Performance | Etch rates |
Typical 1-100 nm/min depending om material and process parameters |
Anisotropy |
| |
Uniformity |
| |
Process parameters | Gas flows |
Etch source:
Deposition source:
|
Substrates | Batch size |
|
Materials allowed |
| |
Possible masking material |
|