Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions
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==Ellipsometer== | ==Ellipsometer== | ||
==Filmtek 4000== | ==Filmtek 4000== | ||
[[image:Filmtek.JPG| | [[image:Filmtek.JPG|275x275px|right|thumb|FilmTek 4000: positioned in cleanroom 2]] | ||
FilmTek 4000 is a computerized film thickness measurement and material characterization system. This system combines fiber-optic spectrophotometry with advanced material modeling software to provide an affordable and reliable tool for the simultaneous measurement of film thickness, index of refraction, and extinction coefficient | FilmTek 4000 is a computerized film thickness measurement and material characterization system. This system combines fiber-optic spectrophotometry with advanced material modeling software to provide an affordable and reliable tool for the simultaneous measurement of film thickness, index of refraction, and extinction coefficient | ||