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Specific Process Knowledge/Characterization/Optical microscope: Difference between revisions

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! Zeiss Jenatech (strain)
! Nikon SMZ 1500
! Leica S8 APO
! Zeiss Original
! Leitz Medilux
! Zeiss Axiotron 2
! Zeiss Jenetech (particles measurements)
! Noco IR microscope
! Nikon SMZ 1000
! Nikon ME 600
! Nikon Eclipse L200
! Nokin Eclipse L200 (2)
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|Location
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|Special features
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|Ocular magnification
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|Objective magnification
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|Bright field
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|Dark field
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|Polarizer
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|Episcopic light (reflected light)
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|Diascopic light (transmitted light)
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|View with eye
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|View on screen (camera)
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|Measurement option
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Revision as of 10:38, 26 September 2012

Zeiss Jenatech (strain) Nikon SMZ 1500 Leica S8 APO Zeiss Original Leitz Medilux Zeiss Axiotron 2 Zeiss Jenetech (particles measurements) Noco IR microscope Nikon SMZ 1000 Nikon ME 600 Nikon Eclipse L200 Nokin Eclipse L200 (2)
Location
Special features
Ocular magnification
Objective magnification
Bright field
Dark field
Polarizer
Episcopic light (reflected light)
Diascopic light (transmitted light)
View with eye
View on screen (camera)
Measurement option



Zeiss (RR2) Leica (RR3) Leitz (RR4 Glassroom1) Zeiss (RR4 Glassroom1) Zeiss (RR4) Nikon (K10 yellow room)
Magnification 25,50,100,

200,500x

50,100,200,

500,1000x

25,50,100,

200,500x

50,100,200,

500,1000x

25,50,100,

200,500x

50,100,200,

500,1000x

Bright field yes yes yes yes yes yes
Dark field yes yes yes yes yes yes
Polarizer yes no no yes yes no
Episcopic light (reflected light) yes yes yes yes yes yes
Diascopic light (transmitted light) no yes yes no no yes
View with eye yes yes yes yes yes yes
View on screen no yes yes yes no yes
Measurement option no no yes yes no yes
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