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Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
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Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
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*Purpose 1
*Measure thinfilm thicknesses and optical constants for single and multilayer optical transparent thinfilms.
*Purpose 2
*Measure opticals constants for bulk material
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*Purpose 1
*Measure growth rate of depositions done in the Sputter System Lesker.
*Purpose 2
*Measure thinfilm thicknesses and optical constants for single and multilayer optical transparent thinfilms.
*Purpose 3
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Performance
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Performance
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