LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions
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*: [[File:Graphical Abstract2.jpg|300px]] | *: [[File:Graphical Abstract2.jpg|300px]] | ||
*: [https://doi.org/10.1016/j.mee.2018.02.023 Link to Article] | *: [https://doi.org/10.1016/j.mee.2018.02.023 Link to Article] | ||
*: A. Han, B. Chang, M. Todeschini, H. T. Le, | *: A. Han, B. Chang, <u>M. Todeschini</u>, H. T. Le, W. Tiddi and M. Keil<br> ''Microelectronic Engineering'', vol. 193, pp. 28-33, 2018. | ||
===Conferences and Workshops Contributions=== | ===Conferences and Workshops Contributions=== | ||