LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions
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*; In-depth evolution of chemical states and sub-10-nm-resolution crystal orientation mapping of nanograins in Ti(5 nm)/Au(20 nm)/Cr(3 nm) trilayer thin films | *; In-depth evolution of chemical states and sub-10-nm-resolution crystal orientation mapping of nanograins in Ti(5 nm)/Au(20 nm)/Cr(3 nm) trilayer thin films | ||
*: [[File: | *: [[:File:3.jpg|300px]] | ||
*: [https://www.sciencedirect.com/science/article/pii/S0169433218313187 Link to Article] | *: [https://www.sciencedirect.com/science/article/pii/S0169433218313187 Link to Article] | ||
*: | *: X. Zhu, <u>M. Todeschini</u>, A. B. da Silva Fanta, L. Liu, F. Jensen, J. Hübner, H. Jansen, A. Han, P. Shi, A. Ming, and C. Xie<br> ''Applied Surface Science'', vol. 453, pp. 365-372, 2018. | ||