LabAdviser/Technology Research/Nanoscale characterization of ultra-thin metal films for nanofabrication applications: Difference between revisions
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*; Elevated temperature transmission Kikuchi diffraction in the SEM | *; Elevated temperature transmission Kikuchi diffraction in the SEM | ||
*: | *: [[:File:2.jpg|300px]] | ||
*: [https://doi.org/10.1016/j.mee.2018.01.021 Link to Article] | *: [https://doi.org/10.1016/j.mee.2018.01.021 Link to Article] | ||
*: A. B. da Silva Fanta, <u>M. Todeschini</u>, A. Burrows, H. Jansen, C. D. Damsgaard, H. Alimadadi, and J. B. Wagner<br> ''Materials Characterization'', vol. 139, pp. 452-462, 2018. | *: A. B. da Silva Fanta, <u>M. Todeschini</u>, A. Burrows, H. Jansen, C. D. Damsgaard, H. Alimadadi, and J. B. Wagner<br> ''Materials Characterization'', vol. 139, pp. 452-462, 2018. | ||